Simulation of X-ray emission from rough surfaces

Authors
Gauvin, R Lifshin, E
Citation
R. Gauvin et E. Lifshin, Simulation of X-ray emission from rough surfaces, MIKROCH ACT, 132(2-4), 2000, pp. 201-204
Citations number
12
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
MIKROCHIMICA ACTA
ISSN journal
00263672 → ACNP
Volume
132
Issue
2-4
Year of publication
2000
Pages
201 - 204
Database
ISI
SICI code
0026-3672(2000)132:2-4<201:SOXEFR>2.0.ZU;2-M
Abstract
A new Monte Carlo program that simulates the full X-ray spectrum, including the characteristic lines and the background, has been developed for specim en having rough surfaces. It is reported that the shape and the intensity o f the X-ray spectrum are a strong function of the beam position. These vari ations are related to the change of generation and absorption of X-rays as the beam is moved across a rough surface.