Orientation imaging microscopy applied to zirconia ceramics

Measurements of crystallographic orientations along with microscopic observ ations are the basis of quantitative investigations of the microstructure o f crystalline materials. The technique that applies automatic orientation m easurements in the transmission or scanning electron microscope is known as orientation imaging microscopy (OIM) [1]. In this paper the measuremcnts a nd analyses of sets of single orientations gained from electron backscatter ed diffraction (EBSD) registered in a scanning electron microscope are pres ented. A quantitative description of microstructure of two polymorphs of zi rconia, based on measurements of single orientations, is also given.