Ia. Yu et al., SURFACE REFLECTION OF SUBMILLIKELVIN ATOMIC-HYDROGEN FROM THIN SUPERFLUID HE-4 FILMS - SUBSTRATE EFFECTS, Physica. B, Condensed matter, 194, 1994, pp. 17-18
We present the results of experiments measuring the film thickness dep
endence of the sticking probability for H on thin films of superfluid
He-4 for H atom temperatures of 0.3 - 4.0 mK. Data is presented for 0.
6 nm to 1 mm thick films on a silver sinter substrate. For the 0.3 mK
H atoms, the sticking probability varies from 0.7 for a film 0.6 nm th
ick to 2 x 10(-2) for films thicker than 1 mum. Our data are in reason
able agreement with recent theoretical calculations.