R. Tomita et al., Determination of hydrolysis ratio of silicic ester on the surface of coated films by X-ray photoelectron spectroscopy (XPS), NIP KAG KAI, (4), 2000, pp. 267-271
The hydrolysis ratio of silicic ester on the surface of coated films was an
alyzed quantitatively by X-ray photoelectron spectroscopy using monochromat
ized AlKalpha X-rays. Alkoxy groups were selectively decomposed on irradiat
ion of non-monochromatized Mg K-alpha X-rays to coated silicate films. This
phenomenon could be used for determination of the number of alkoxy groups
bonded to one silicon atom. This method was applied to evaluate the hydroly
sis ratio of various silicic ester coating films. A good correlation was ob
tained between hydrolysis ratio which was measured by XPS and water contact
angle which indicate hydrophilicity of the surface of coated films.