Login
|
New Account
ITA
ENG
Rifts in US patent system spur National Research Council to undertake "most ambitious exam ever"
Authors
Lepkowski, W
Citation
W. Lepkowski, Rifts in US patent system spur National Research Council to undertake "most ambitious exam ever", RES TECH M, 43(3), 2000, pp. 2-4
Categorie Soggetti
Management,"Engineering Management /General
Journal title
RESEARCH-TECHNOLOGY MANAGEMENT
ISSN journal
08956308 →
ACNP
Volume
43
Issue
3
Year of publication
2000
Pages
2 - 4
Database
ISI
SICI code
0895-6308(200005/06)43:3<2:RIUPSS>2.0.ZU;2-C