Rifts in US patent system spur National Research Council to undertake "most ambitious exam ever"

Authors
Citation
W. Lepkowski, Rifts in US patent system spur National Research Council to undertake "most ambitious exam ever", RES TECH M, 43(3), 2000, pp. 2-4
Categorie Soggetti
Management,"Engineering Management /General
Journal title
RESEARCH-TECHNOLOGY MANAGEMENT
ISSN journal
08956308 → ACNP
Volume
43
Issue
3
Year of publication
2000
Pages
2 - 4
Database
ISI
SICI code
0895-6308(200005/06)43:3<2:RIUPSS>2.0.ZU;2-C