Incident beam diffraction in electron stimulated desorption

Citation
Mt. Sieger et Tm. Orlando, Incident beam diffraction in electron stimulated desorption, SURF SCI, 451(1-3), 2000, pp. 31-40
Citations number
24
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
451
Issue
1-3
Year of publication
2000
Pages
31 - 40
Database
ISI
SICI code
0039-6028(20000420)451:1-3<31:IBDIES>2.0.ZU;2-M
Abstract
We describe a new experimental technique utilizing incident beam diffractio n in electron stimulated desorption (ESD) to determine the initial atomic b onding structure of desorbates. Diffraction in ESD can provide detailed inf ormation about the ground stale surface bonding geometry of the absorber wi th sub-angstrom resolution of bond vectors. We discuss the role of electron diffraction in ESD, and demonstrate these ideas with experimental measurem ents of Cl+ ion ESD from chlorinated Si(111)-(7 x 7) and (1 x 1) surfaces. (C) 2000 Elsevier Science B.V. All rights reserved.