DIGITAL ANALYSIS OF X-RAY-FILMS

High-resolution intensity profiles can be generated from X-ray diffrac tion films using a desk-top scanner and computer image analysis. The r esulting intensity profiles have spatial resolutions equal to, or exce eding that of modern powder diffractometers - at a fraction of the cos t. This technique provides an economical way of preserving the informa tion stored in libraries of old (and deteriorating) powder diffraction films. The same technique can also be extended to permit quantitative analysis of single-crystal diffraction films.