Self-trapping of negative ions due to electron detachment in the afterglowof electronegative gas plasmas

Citation
Id. Kaganovich et al., Self-trapping of negative ions due to electron detachment in the afterglowof electronegative gas plasmas, APPL PHYS L, 76(20), 2000, pp. 2844-2846
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
20
Year of publication
2000
Pages
2844 - 2846
Database
ISI
SICI code
0003-6951(20000515)76:20<2844:SONIDT>2.0.ZU;2-C
Abstract
The spatiotemporal evolution of charged species densities and wall fluxes d uring the afterglow of an electronegative discharge has been investigated. It was found that plasma decay crucially depends on the product of negative -ion-detachment frequency (gamma(d)) and diffusion time tau(d). If gamma(d) tau(d)> 2, negative ions convert to electrons during their diffusion toward s the walls. The presence of detached electrons results in "self-trapping" of the negative ions, due to emerging electric fields, and the negative-ion flux to the walls is extremely small. Thus, negative ions can be extracted in the afterglow only if gamma(d)tau(d)< 2. (C) 2000 American Institute of Physics. [S0003-6951(00)00320-X].