Observation of electronic Raman scattering from Mg-doped wurtzite GaN

Citation
Kt. Tsen et al., Observation of electronic Raman scattering from Mg-doped wurtzite GaN, APPL PHYS L, 76(20), 2000, pp. 2889-2891
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
20
Year of publication
2000
Pages
2889 - 2891
Database
ISI
SICI code
0003-6951(20000515)76:20<2889:OOERSF>2.0.ZU;2-8
Abstract
Electronic Raman scattering experiments have been carried out on both molec ular beam epitaxy and metal-organic chemical vapor deposition-grown Mg-dope d wurtzite GaN samples. Aside from the expected Raman lines, a broad struct ure (full width at half maximum congruent to 15 cm(-1)) observed at around 841 cm(-1) is attributed to the electronic Raman scattering from neutral Mg impurities in Mg-doped GaN. Our experimental results demonstrate that the energy between the ground and first excited states of Mg impurities in wurt zite GaN is about one-half of its binding energy. (C) 2000 American Institu te of Physics. [S0003- 6951(00)01420-0].