Magnetic domain and domain-wall imaging of submicron Co dots by probing the magnetostrictive response using atomic force microscopy

Citation
J. Wittborn et al., Magnetic domain and domain-wall imaging of submicron Co dots by probing the magnetostrictive response using atomic force microscopy, APPL PHYS L, 76(20), 2000, pp. 2931-2933
Citations number
30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
20
Year of publication
2000
Pages
2931 - 2933
Database
ISI
SICI code
0003-6951(20000515)76:20<2931:MDADIO>2.0.ZU;2-K
Abstract
An approach to image the domains and domain walls of small ferromagnetic en tities using atomic force microscopy (AFM), with a nonmagnetic AFM probe, h as been developed. Exciting the sample in an external ac magnetic field, th e distribution of magnetostrictive response at the surface is detected. By this technique, the domains and domain walls of submicron Co dots have been imaged with a 1 nm lateral resolution. In elliptical Co dots with a 350-nm -long axis on a triangular lattice array with 400 nm periodicity, we find e vidence for two domains with opposite magnetization orientation across a wa ll. The domain-wall width in these dots is found to be about 35 nm. Further more, we observe a ferromagnetic alignment of the domains in the neighborin g dots, which suggests a magnetostatic interaction among the dots. (C) 2000 American Institute of Physics. [S0003-6951(00)02020-9].