Observation of polysilane by near-field scanning optical microscope for ultraviolet (UV) region

Citation
M. Arai et al., Observation of polysilane by near-field scanning optical microscope for ultraviolet (UV) region, J LUMINESC, 87-9, 2000, pp. 951-953
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF LUMINESCENCE
ISSN journal
00222313 → ACNP
Volume
87-9
Year of publication
2000
Pages
951 - 953
Database
ISI
SICI code
0022-2313(200005)87-9:<951:OOPBNS>2.0.ZU;2-H
Abstract
Near-field scanning optical microscope (NSOM) for ultraviolet (UV) region b ased on a triple tapered probe and an atomically flat sapphire plate techni que has been developed. We demonstrate the fluorescence images of polysilan e molecules dispersed on sapphire plate with ultra-flat surface utilizing t he UV-NSOM system. (C) 2000 Elsevier Science B.V. All rights reserved.