An experimental investigation of the angular distribution of the light scat
tered by randomly rough, two-dimensional, isotropic dielectric surfaces is
presented. The surfaces, whose profiles constitute good approximations to G
aussian random processes with Gaussian correlation functions, are fabricate
d in a photoresist and characterized by means of a mechanical profilometer.
The substrates employed in the fabrication of the samples consist of thick
parallel plates of filter glass that absorb the incident light and whose r
efractive index is close to that of the photoresist. This allows us to appr
oximate experimentally a situation in which the light is scattered by a ran
domly rough interface between two semi-infinite dielectric media, illuminat
ed from the air side. The results display features that can be attributed t
o multiple scattering. In particular, significant amounts of cross-polarize
d scattered light, as well as an enhanced backscattering peak, were observe
d in the scattering measurements.