Light scattering by randomly rough isotropic dielectric surfaces

Citation
Ei. Chaikina et al., Light scattering by randomly rough isotropic dielectric surfaces, J MOD OPT, 47(6), 2000, pp. 1013-1024
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF MODERN OPTICS
ISSN journal
09500340 → ACNP
Volume
47
Issue
6
Year of publication
2000
Pages
1013 - 1024
Database
ISI
SICI code
0950-0340(20000515)47:6<1013:LSBRRI>2.0.ZU;2-A
Abstract
An experimental investigation of the angular distribution of the light scat tered by randomly rough, two-dimensional, isotropic dielectric surfaces is presented. The surfaces, whose profiles constitute good approximations to G aussian random processes with Gaussian correlation functions, are fabricate d in a photoresist and characterized by means of a mechanical profilometer. The substrates employed in the fabrication of the samples consist of thick parallel plates of filter glass that absorb the incident light and whose r efractive index is close to that of the photoresist. This allows us to appr oximate experimentally a situation in which the light is scattered by a ran domly rough interface between two semi-infinite dielectric media, illuminat ed from the air side. The results display features that can be attributed t o multiple scattering. In particular, significant amounts of cross-polarize d scattered light, as well as an enhanced backscattering peak, were observe d in the scattering measurements.