The reflection from a semi-infinite chiral medium is analyzed rigourously b
y obtaining the Fresnel coefficients of reflection as well as the depolariz
ation coefficients for the case of illumination by a plane wave with linear
polarization. The chiral material is described electromagnetically by the
constitutive relations D = epsilon(0)<(epsilon)over cap>E + i xi(c)B and H
= i xi(c)E + (1/mu mu(0))B, where epsilon(ij) = epsilon(perpendicular to)(d
elta(ij) - n(i)n(j)) + epsilon(II)n(i)n(j) is the dielectric tensor of the
chiral substrate (z less than or equal to 0), n is the normal vector to the
half-space, mu is the magnetic permeability, epsilon(0) and mu(0) are Vacu
um permittivity and permeability, xi(c)[Omega(-1)] is the chiral component
of the polymer admittance. The constants epsilon(perpendicular to)(omega),
epsilon(II)(omega), xi(c)(omega), mu(omega) are supposed to be complex and
to have values that are determined by usual ellipsometric measurements. For
small values of the dimensionless chirality parameter \g(c)\ = root(mu(0)/
epsilon(0))\xi(c)\ and by supposing epsilon(perpendicular to) = epsilon(II)
= epsilon = epsilon(1) + i epsilon(2), mu = 1 (the isotropic nonmagnetic c
ase) and appropriate perturbation theory is developed Ellipsometric charact
erization (and its interpretation) for the polymer sample P7MB (poli-bi-ben
zoate with spacers containing 7 ethylene units) is given.