G. Mountjoy et al., Changes in the Zr environment in zirconia-silica xerogels with compositionand heat treatment as revealed by ZrK-edge XANES and EXAFS, PHYS CHEM P, 2(10), 2000, pp. 2455-2460
X-ray absorption spectroscopy at the Zr K-edge is an important technique fo
r probing the environment of Zr. Here it is applied to zirconia-silica xero
gels with composition 0.07 less than or equal to x less than or equal to 0.
40, where x is the molar ratio Zr : (Zr + Si). Reference samples of crystal
line ZrO2, ZrSiO4, BaZrO3 and liquid Zr n-propoxide were also examined. New
XANES (X-ray adsorption near edge structure) results are presented for zir
conia-silica xerogels, and compared with previous EXAFS (extended X-ray abs
orption fine structure) results. For high Zr contents (x = 0.4) there is a
separate, amorphous ZrO2 phase, which before heat treatment is similar to Z
r hydroxide, and after heat treatment at 750 degrees C is similar to an amo
rphous precursor of tetragonal ZrO2. For low Zr contents (x = 0.1) there is
atomic mixing of Zr in the SiO2 network, and the environment of Zr is more
similar to that in Zr n-propoxide compared to other reference samples. New
in situ XANES and EXAFS results are presented for x = 0.1 xerogels heated
at 250 degrees C. These clearly show that the Zr environment depends on amb
ient moisture in addition to heat treatment.