A systematic study on the nature of Pr doping in Bi2PrxCa3-xCu2O8+delta (0.
2 less than or equal to x less than or equal to 0.6) has been made on films
grown by laser ablation. These films are a metastable Bi-2212 phase which
has net yet been grown in this doping range by other methods. The film with
x = 0.2 shows the highest zero-resistance temperature (T-cz) of about 65 K
. T-cz of the films decreases with increasing Pr content yielding a metal-t
o-insulator transition for x > 0.5. By analyzing x-ray photoelectron spectr
a we show that Pr is trivalent. From this we are able to demonstrate that t
he variation of T-cz with doping is predominantly due to hole filling induc
ed by the trivalent Pr.