The morphology & electrochemical behavior of electrodeposited nickel onto metallized silicon

Citation
L. Robert et al., The morphology & electrochemical behavior of electrodeposited nickel onto metallized silicon, PLAT SURF F, 87(5), 2000, pp. 153-159
Citations number
31
Categorie Soggetti
Metallurgy
Journal title
PLATING AND SURFACE FINISHING
ISSN journal
03603164 → ACNP
Volume
87
Issue
5
Year of publication
2000
Pages
153 - 159
Database
ISI
SICI code
0360-3164(200005)87:5<153:TM&EBO>2.0.ZU;2-M
Abstract
Electrodeposition of nickel from a nickel sulfamate electrolyte onto five s ubstrates (copper, metallized glass, metallized copper and metallized n-typ e and p-type silicon) was studied. Analysis by scanning electron microscopy showed the first step of growth and the morphology of a thick nickel coati ng. The nature of the substrate had a great influence on the electrocrystal lization via the density of germination. Both cathodic polarization and imp edance spectroscopy diagrams revealed the electrochemical behavior that cha racterizes the silicon/metal interface and allows classifying the metallic interfaces into three groups, depending on conductivity.