STUDY OF TISE2 NBSE2 SUPERLATTICES WITH SCANNING-TRANSMISSION X-RAY MICROSCOPY/

Citation
Hj. Shin et al., STUDY OF TISE2 NBSE2 SUPERLATTICES WITH SCANNING-TRANSMISSION X-RAY MICROSCOPY/, Journal of the Korean Physical Society, 30(3), 1997, pp. 575-579
Citations number
18
Categorie Soggetti
Physics
ISSN journal
03744884
Volume
30
Issue
3
Year of publication
1997
Pages
575 - 579
Database
ISI
SICI code
0374-4884(1997)30:3<575:SOTNSW>2.0.ZU;2-A
Abstract
A scanning transmission X-ray microscope (STXM) has been applied to st udy TiSe2/NbSe2 superlattices crystallized from an elementally modulat ed film. The STXM images show that the superlattice sample has structu res with sizes on the order of one micrometer in the x-y plane. X-ray absorption spectra (XAS) show that the titanium in the structure is in the form of a mixture of crystalline TiSe2 and metallic Ti. The struc ture shows interfacial nucleation of the layers in the kinetic trappin g method with different domain sizes for different sets of TiSe2 and N bSe2 layer numbers in a unit-cell. The XAS obtained using the STXM pro vide detailed chemical and structural information generally not availa ble using conventional total electron yield detection.