Hj. Shin et al., STUDY OF TISE2 NBSE2 SUPERLATTICES WITH SCANNING-TRANSMISSION X-RAY MICROSCOPY/, Journal of the Korean Physical Society, 30(3), 1997, pp. 575-579
A scanning transmission X-ray microscope (STXM) has been applied to st
udy TiSe2/NbSe2 superlattices crystallized from an elementally modulat
ed film. The STXM images show that the superlattice sample has structu
res with sizes on the order of one micrometer in the x-y plane. X-ray
absorption spectra (XAS) show that the titanium in the structure is in
the form of a mixture of crystalline TiSe2 and metallic Ti. The struc
ture shows interfacial nucleation of the layers in the kinetic trappin
g method with different domain sizes for different sets of TiSe2 and N
bSe2 layer numbers in a unit-cell. The XAS obtained using the STXM pro
vide detailed chemical and structural information generally not availa
ble using conventional total electron yield detection.