Monte Carlo models of crystal growth have contributed to the theoretical un
derstanding of thin film deposition, and are now becoming available as tool
s to assist in device fabrication. Because they combine efficient computati
on and atomic-level detail, these models can be applied to a large number o
f crystallization phenomena. They have played a central role in the underst
anding of the surface roughening transition and its effect on crystal growt
h kinetics. Ln addition, columnar growth, vacancy and impurity trapping, an
d other growth phenomena that are closely related to atomic-level structure
have been investigated by these simulations. in this chapter we review som
e of these applications and discuss MC modeling of sputter deposition based
on materials parameters derived from first principles and molecular dynami
cs methods. We discuss models of deposition which include the atomic scale,
but can also simulate film structure evolution on time scales of the order
of hours. By the use of advanced computers and algorithms, we can now simu
late systems large enough to exhibit clustered, columnar, and polycrystalli
ne film structures. The event distribution is determined from molecular dyn
amics simulations, which can give diffusion rates, defect production, sputt
ering yields, and other information needed to match real materials. We disc
uss simulations of deposition into small vias and trenches, and their exten
sion to the length scale of real devices through scaling relations. (C) 200
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