Chemical vapor deposition and morphology problems

Citation
Jj. Thiart et al., Chemical vapor deposition and morphology problems, THIN SOL FI, 365(2), 2000, pp. 275-293
Citations number
32
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
365
Issue
2
Year of publication
2000
Pages
275 - 293
Database
ISI
SICI code
0040-6090(20000417)365:2<275:CVDAMP>2.0.ZU;2-F
Abstract
A model for chemical vapor deposition (CVD) at or near atmospheric pressure is presented. A linear stability analysis of planar growth is presented an d a dispersion relation is derived that relates species transport, surface diffusion, surface tension and geometrical factors with the growth of pertu rbations. Severe fingering requires a description with are-length as the in dependent variable. The finite element method is described to solve the evo lution of the interface and of the gas-phase species concentration directly above the interface. Some examples are also given. (C) 2000 Published by E lsevier Science S.A. All rights reserved.