Fragmentation of dodecanethiol molecules: application to self-assembled monolayer damage in atom lithography

Citation
Jd. Close et al., Fragmentation of dodecanethiol molecules: application to self-assembled monolayer damage in atom lithography, APP PHYS B, 70(5), 2000, pp. 651-655
Citations number
38
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS B-LASERS AND OPTICS
ISSN journal
09462171 → ACNP
Volume
70
Issue
5
Year of publication
2000
Pages
651 - 655
Database
ISI
SICI code
0946-2171(200005)70:5<651:FODMAT>2.0.ZU;2-T
Abstract
Atom lithography commonly employs self-assembled monolayers (SAMs) of alkan ethiols which act as resists to protect prepared surfaces. Metastable atomi c species such as helium are used to damage the resist, enabling pattern tr ansfer via mask lithography, followed by wet chemical etching. The damage m echanism is, however, not well understood. Were we report studies of fragme ntation of dodecanethiol (DDT) molecules embedded in helium nanodroplets th at have been irradiated by an electron beam. The results of the charge-tran sfer fragmentation process provide the first experimental data on the damag e mechanisms that occur in the metastable helium/SAM interaction.