Thermal stability of IrMn and MnFe exchange-biased magnetic tunnel junctions

Citation
Mg. Samant et al., Thermal stability of IrMn and MnFe exchange-biased magnetic tunnel junctions, APPL PHYS L, 76(21), 2000, pp. 3097-3099
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
21
Year of publication
2000
Pages
3097 - 3099
Database
ISI
SICI code
0003-6951(20000522)76:21<3097:TSOIAM>2.0.ZU;2-E
Abstract
The thermal stability of exchange-biased magnetic tunnel junctions is explo red using near-edge x-ray absorption fine-structure spectroscopy. Structure s with Ir-Mn antiferromagnetic exchange bias layers are much more thermally stable than similar structures with Fe-Mn exchange bias layers. In both ca ses, diffusion of Mn from the antiferromagnetic layer through thin exchange -biased ferromagnetic layers to the tunnel barrier is observed at elevated temperatures. This observation explains the diminished magnetoresistance of these structures on annealing even though the resistance of the tunnel jun ctions is hardly changed. (C) 2000 American Institute of Physics. [S0003-69 51(00)04621-0].