Dielectric properties of pulsed-laser-deposited calcium titanate thin films

Citation
Jh. Hao et al., Dielectric properties of pulsed-laser-deposited calcium titanate thin films, APPL PHYS L, 76(21), 2000, pp. 3100-3102
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
21
Year of publication
2000
Pages
3100 - 3102
Database
ISI
SICI code
0003-6951(20000522)76:21<3100:DPOPCT>2.0.ZU;2-S
Abstract
We have deposited CaTiO3 thin films on SrRuO3 electrode layers on SrTiO3 an d LaAlO3 substrates by pulsed laser deposition. The low-frequency dielectri c properties were measured from 4 to 300 K. We found that the dielectric co nstants of 1-mu m-thick CaTiO3 films are very close to that observed in the bulk materials. The dielectric loss depends on the temperature and is on t he order of 10(-4) at low temperature. The dielectric constants of the film s can be tuned by electric field by 6% at room temperature and 10% at 200 K . (C) 2000 American Institute of Physics. [S0003- 6951(00)01321-8].