Frequency multiplier measurements on heterostructure barrier varactors on a copper substrate

Citation
L. Dillner et al., Frequency multiplier measurements on heterostructure barrier varactors on a copper substrate, IEEE ELEC D, 21(5), 2000, pp. 206-208
Citations number
10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE ELECTRON DEVICE LETTERS
ISSN journal
07413106 → ACNP
Volume
21
Issue
5
Year of publication
2000
Pages
206 - 208
Database
ISI
SICI code
0741-3106(200005)21:5<206:FMMOHB>2.0.ZU;2-I
Abstract
We hare fabricated heterostructure barrier varactors (HBV) on a copper subs trate, which offers reduced spreading resistance, and improved thermal cond uctivity compared to an LnP substrate. The devices are fabricated without d egrading the electrical characteristics. The three-barrier HBV material gro wn by MOVPE has a leakage current of only 0.1 mu A/mu m(2) at 19 (V) under bar, The maximum capacitance is 0.54 fF/mu m(2). In It frequency tripler ex periment a maximum output power of 7.1 mW was generated at 221 GHz with a f lange-to-flange efficiency of 7.9%.