Ultrathin-body SOI MOSFET for deep-sub-tenth micron era

Citation
Yk. Choi et al., Ultrathin-body SOI MOSFET for deep-sub-tenth micron era, IEEE ELEC D, 21(5), 2000, pp. 254-255
Citations number
4
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE ELECTRON DEVICE LETTERS
ISSN journal
07413106 → ACNP
Volume
21
Issue
5
Year of publication
2000
Pages
254 - 255
Database
ISI
SICI code
0741-3106(200005)21:5<254:USMFDM>2.0.ZU;2-7
Abstract
A 40-nm-gate-length ultrathin-body (UTB) nMOSFET is presented with 20-nm bo dy thickness and 2.4-nm gate oxide, The UTB structure eliminates leakage pa ths and is an extension of a conventional SOI MOSFET for deep-sub-tenth mic ron CMOS. Simulation shows that the UTB SOI MOSFET can be scaled down to 18 -nm gate length with <5 nm UTB. A raised poly-Si S/D process is employed to reduce the parasitic series resistance.