Dynamically shift-switched dataline redundancy suitable for DRAM macro with wide data bus

A novel dateline redundancy suitable for an embedded DRAM macro with wide d ata bus is presented. This redundancy reduces the area required for spare c ells from 6 to 1.6% of the area required for normal cells and improves chip yield from 50 to 80%. In addition, it provides a high speed data path. An embedded DRAM macro adopting the redundancy achieves 200-MHz operation and provides 51.2-Gbit/s bandwidth. It has been fabricated with 0.25-mu m techn ology.