Semiconductor microlenses fabricated by one-step wet etching

Citation
Ys. Kim et al., Semiconductor microlenses fabricated by one-step wet etching, IEEE PHOTON, 12(5), 2000, pp. 507-509
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE PHOTONICS TECHNOLOGY LETTERS
ISSN journal
10411135 → ACNP
Volume
12
Issue
5
Year of publication
2000
Pages
507 - 509
Database
ISI
SICI code
1041-1135(200005)12:5<507:SMFBOW>2.0.ZU;2-Y
Abstract
We fabricated refractive semiconductor microlenses using a diffusion-limite d chemical etching technique based on Br-2 solution. The simple one-step we t etching process produced high-quality microlenses of GaAs and InP, the tw o most popular compound semiconductor materials used in optoelectronics. A spherical GaAs microlens with a nominal lens diameter of 30 mu m exhibited a radius of curvature and focal length of 91 and 36 mu m, respectively. The surface roughness, examined by atomic force microscopy (AFM), was measured to be below +/-10 Angstrom. This microlens fabrication method should be re adily applicable due to the simplicity in processing and the high-quality r esults.