L. Sabatier et al., Electron backscattered diffraction and atomic force microscopy analysis ofslip bands induced by fatigue in 316L austenitic stainless steel, J PHYS IV, 10(P6), 2000, pp. 197-203
The techniques of Electron BackScattered Diffraction (EBSD) and Atomic Forc
e Microscopy (AFM) have been associated to study surface slip features on 3
16L austenitic stainless steel polycrystals tested in the Low Cycle Fatigue
(LCF) range. EBSD investigations allow the identification of activated sli
p planes for each grain, the determination of slip directions based on Schm
id factors calculations as the local inclination of the slip plane accordin
g to the surface. AFM allows the measurement of steps height induced at the
surface along slip bands and also the characterization of the local morpho
logy of extrusions at a nanometric scale. In this study both techniques are
used on the same surface of interest in order to combine crystallographic
and topographic information. Consequently a schematic model of the slip ban
d emergence is proposed.