The physical origin of surface relief patterning on amorphous polymer films
containing azobenzene-side chains induced by holographic exposure with vis
ible light of about 450 nm is not yet fully understood. To understand the n
ature of the induced material transport is of special interest to describe
the dynamic processes occurring in thin films below the glass transition te
mperature T-G. Thus, we investigated films made from the polar (poly {4'-[2
-(methacryloxy) ethyl]-ethyl}amino-4-nitroazobenzene, T-G=129 degrees C) an
d less polar {poly[4-(2-methacryloxy)-ethyl] azobenzene, T-G=80 degrees C}
azobenzene side-chain homopolymers and performed temperature-resolved coher
ent x-ray and visible (VIS) light scattering measurements of the thermally
induced erasure of the surface gratings. The simultaneous use of x-ray sync
hrotron light (lambda=0.14 nm) and VIS laser light (lambda=633 nm) allows t
he detection of the material flow on different lengths scales. We did not f
ind remarkable differences in the thermal behavior of polar and nonpolar ma
terials. Depending on the time used for inscribing the gratings the VIS sig
nal starts vanishing at a critical temperature T-K below the glass temperat
ure T-G. Up to T-G the x-ray grating peak intensities increase to a maximum
even if the VIS signal is almost zero. Probing the grating in a different
depth below the surface, the first and second order x-ray Fourier component
s reach their intensity maxima at different temperatures and rise up in int
ensity with time constants characterized by an Arrhenius-like activation en
ergy of about 2.6 eV. At T > T-G the grating peak intensities go to zero. O
ur measurements can be interpreted by a model of anisotropic viscosity. At
T < T-G the erasing of the surface grating takes place by a material flow p
erpendicular to the initial surface. This is accompanied by the formation o
f an intrinsic density grating within the film against the shear tension of
the polymer. At T > T-G the created lateral density modulation becomes equ
alized by a lateral material flow quantified by a diffusion coefficient of
about D=3x10(-13) cm(2) s(-1). (C) 2000 American Institute of Physics. [S00
21-8979(00)08011-7].