Je. Yater et A. Shih, Secondary electron emission characteristics of single-crystal and polycrystalline diamond, J APPL PHYS, 87(11), 2000, pp. 8103-8112
Secondary electron emission spectroscopy (SEES) is used to examine the tran
sport and emission of low-energy electrons in diamond. In particular, SEES
measurements from single-crystal (100) and (111) diamond and polycrystallin
e chemical vapor deposited (CVD) diamond are compared in order to examine t
he effect of crystallographic orientation on the emission characteristics.
Crystal orientation is found to influence the surface properties of the sam
ples but not the low-energy transport properties. Specifically, very high y
ields are obtained from negative-electron-affinity (NEA) surfaces of all th
ree samples, indicating that low-energy electrons are transported and emitt
ed very efficiently regardless of crystal orientation. However, the energy
distributions measured from adsorbate-covered C(111) surfaces are broader a
nd shifted lower in energy than those measured from corresponding C(100) su
rfaces. In fact, the energy distributions measured from polycrystalline CVD
diamond surfaces appear to be a superposition of the energy distributions
measured from the (100) and (111) crystal faces. For all three samples, a b
roader, lower-energy distribution is measured from cesiated NEA surfaces th
an from hydrogenated NEA surfaces. This indicates that the electron emissio
n process differs at the two types of surfaces. The emission characteristic
s observed for the different crystal orientations and adsorbate coverages c
an be understood by considering the role of surface structure in the emissi
on process. [S0021-8979(00)04711-3].