Sf. Yu, Mb",rusli,"yoon et al., Deposition of nanocrystalline cubic silicon carbide films using the hot-filament chemical-vapor-deposition method, J APPL PHYS, 87(11), 2000, pp. 8155-8158
Nanocrystalline cubic silicon carbide (3C-SiC) films embedded in an amorpho
us SiC matrix were fabricated by the hot-filament chemical-vapor-deposition
technique using methane and silane as reactance gases. High-resolution tra
nsmission electron micrographs clearly showed that these films contain naon
crystallites, with an average dimension of about 7 nm, embedded within an a
morphous matrix. X-ray photoelectron spectroscopy, x-ray diffraction, infra
red absorption, and Raman scattering studies revealed the nanocrystallites
as having the structure of that of 3C-SiC. In contrast to 3C-SiC, where no
photoluminescence could be observed at room temperature, strong visible emi
ssion with a peak energy of 2.2 eV could be seen from the nanocrystalline f
ilms at room temperature. The presence of nanocrystalline cubic SiC in thes
e films is believed to result in a change in their energy-band structure, c
ompared to that of 3C-SiC, which promotes radiative recombination of electr
on-hole pairs. (C) 2000 American Institute of Physics. [S0021-8979(00)04411
-X].