Citation
S. Takeda et D. Cherns, Preface to recent developments in the electron microscopy of semiconductors, J ELEC MICR, 49(2), 2000, pp. 209-209
Categorie Soggetti
Multidisciplinary
Journal title
JOURNAL OF ELECTRON MICROSCOPY
ISSN journal
00220744
→ ACNP
Volume
49
Issue
2
Year of publication
2000
Pages
209 - 209
Database
ISI
SICI code
0022-0744(2000)49:2<209:PTRDIT>2.0.ZU;2-B