Short range ordering in amorphous In-Se films by wide-angle X-ray scattering

Citation
A. Burian et al., Short range ordering in amorphous In-Se films by wide-angle X-ray scattering, J MATER SCI, 35(12), 2000, pp. 3121-3126
Citations number
41
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
35
Issue
12
Year of publication
2000
Pages
3121 - 3126
Database
ISI
SICI code
0022-2461(200006)35:12<3121:SROIAI>2.0.ZU;2-D
Abstract
Wide-angle X-ray scattering studies were performed on In-Se amorphous films , obtained by thermal evaporation, with selenium content of 60 and 66 at.%. The intensities were recorded in the scattering vector range between 3 and 160 nm(-1). Structural information about the local structure of the amorph ous In-Se films has been derived from the radial distribution function usin g the curve-fitting method. The experimental results have been compared wit h model based simulations. The obtained structural parameters indicate that for In40Se60 In-In, In-Se and Se-Se contributions are involved in the near -neighbour coordination sphere. As the Se content is increased, the number of In-In bonds is reduced to zero, within the precision of the method. For both amorphous films In is tetrahedrally coordinated while Se has three nea r neighbours on the average. (C) 2000 Kluwer Academic Publishers.