Influence of air exposures and thermal treatments on the secondary electron yield of copper

Citation
I. Bojko et al., Influence of air exposures and thermal treatments on the secondary electron yield of copper, J VAC SCI A, 18(3), 2000, pp. 972-979
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
18
Issue
3
Year of publication
2000
Pages
972 - 979
Database
ISI
SICI code
0734-2101(200005/06)18:3<972:IOAEAT>2.0.ZU;2-M
Abstract
The variation of the secondary electron yield (SEY) of sputter-cleaned oxyg en-free high-conductivity copper has been studied as a function of air expo sure duration at room temperature. After short air exposures of some second s the maximum SEY (delta(max)) of clean copper is reduced from 1.3 to less than 1.2, due to the oxidation of the copper surface. Prolonged air exposur e increases the SEY steadily until, after about 8 days of atmospheric expos ure, delta(max) is higher than 2. Air exposures at higher temperatures have been found to be effective in reducing the SEY of technical copper surface s. A 5 min air exposure of copper at 350 degrees C followed by a 350 degree s C bakeout under vacuum reduces delta(max) to about 1.05, which is lower t han the value of pure copper and that of Cu2O. (C) 2000 American Vacuum Soc iety. [S0734-2101(00)04103-8].