The variation of the secondary electron yield (SEY) of sputter-cleaned oxyg
en-free high-conductivity copper has been studied as a function of air expo
sure duration at room temperature. After short air exposures of some second
s the maximum SEY (delta(max)) of clean copper is reduced from 1.3 to less
than 1.2, due to the oxidation of the copper surface. Prolonged air exposur
e increases the SEY steadily until, after about 8 days of atmospheric expos
ure, delta(max) is higher than 2. Air exposures at higher temperatures have
been found to be effective in reducing the SEY of technical copper surface
s. A 5 min air exposure of copper at 350 degrees C followed by a 350 degree
s C bakeout under vacuum reduces delta(max) to about 1.05, which is lower t
han the value of pure copper and that of Cu2O. (C) 2000 American Vacuum Soc
iety. [S0734-2101(00)04103-8].