Exit wave reconstructions using through focus series of HREM images

The through focus exit wave reconstruction technique uses a series of high resolution electron microscopy images to reconstruct the complex electron w avefunction at the exit plane of the specimen. The feasibility of the throu gh focus exit wave reconstruction method and its most important limitations are discussed. It is shown that-provided all aberrations of the microscope are well corrected for-a large improvement in the interpretability of the information can be obtained. Microsc. Res. Tech. 49:301-323, 2000. (C) 2000 Wiley-Liss, Inc.