In order to investigate the strong electronic excitation effect, mainly inc
luding transformation from crystalline into amorphous state, of thin fuller
ite films in more detail, C-60 films were irradiated by 171.2 MeV S9+ and 1
20 keV H ions. The irradiated samples were analysed by means of Raman scatt
ering and X-ray photoelectron spectroscopy (XPS) techniques. The analysis r
esults indicated that the amorphization process of C60 films irradiated by
both ions is fully dominated by electronic energy transfer. An annealing ef
fect of strong electronic excitation, which induced the intermediate graphi
tization process before amorphization in the case of H ion irradiation, was
found for the first time. But in the case of S9+ ion irradiation, the dest
ructive action of the strong electronic excitation exceeds the annealing ef
fect, and therefore there is no intermediate graphitization process. (C) 20
00 Elsevier Science B.V. All rights reserved.