The surface insulator-metallic phase transition of epitaxial magnetite thin film observed by low-energy ion scattering

Citation
Nth. Kim-ngan et al., The surface insulator-metallic phase transition of epitaxial magnetite thin film observed by low-energy ion scattering, NUCL INST B, 164, 2000, pp. 992-998
Citations number
20
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
164
Year of publication
2000
Pages
992 - 998
Database
ISI
SICI code
0168-583X(200004)164:<992:TSIPTO>2.0.ZU;2-T
Abstract
The (1 1 1) surface of the magnetite thin film has been investigated by low -energy ion scattering (LEIS) in the small-angle geometry and in the temper ature range 85-300 K. The thin film has been grown by molecular beam epitax y (MBE) and characterized by low-energy electron diffraction (LEED), scanni ng tunneling microscopy (STM) and conversion electron Mossbauer spectroscop y (CEMS). The temperature dependence of the scattered ion yield, R+(T), obt ained by LEIS technique has shown anomaly around 120 K attributed to the in sulator-metallic phase transition of this material. The character of the R(T) curve has been found to depend on the velocity of incoming ions. The re sonant and Auger neutralization, which depends on the density of state and on the degree of electron localization, can be responsible for the behavior of the R+(T) curve, especially in the phase transition region. (C) 2000 El sevier Science B.V. All rights reserved.