Depth-resolved profile of the magnetic field beneath the surface of a superconductor with a few nm resolution

Citation
Tj. Jackson et al., Depth-resolved profile of the magnetic field beneath the surface of a superconductor with a few nm resolution, PHYS REV L, 84(21), 2000, pp. 4958-4961
Citations number
25
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
84
Issue
21
Year of publication
2000
Pages
4958 - 4961
Database
ISI
SICI code
0031-9007(20000522)84:21<4958:DPOTMF>2.0.ZU;2-P
Abstract
The variation of a magnetic field as a function of depth beneath the surfac e of an YBa2Cu3O7-delta thin film in the Meissner state has been measured u sing low energy muons. The depth of implantation was varied from 20-150 nm by tuning the energy of the implanted muons from 3-30 keV. These are direct measurements of the penetration of a magnetic field beneath a superconduct ing surface which illustrate the power of low energy muons for near surface studies in superconductivity and magnetism.