J. Holm et al., Through-etched silicon carriers for passive alignment of optical fibers tosurface-active optoelectronic components, SENS ACTU-A, 82(1-3), 2000, pp. 245-248
Silicon carriers for passive alignment of optical fibers to surface-active
optoelectronic components with micrometer precision are presented. The carr
iers are through-etched by deep reactive ion etching (DRIE) to make vertica
l fiber alignment holes that go through the chip. On the top surface of the
carrier, high-precision electrodes and eutectic AuSn-solder bumps are depo
sited by evaporation and electroplating. Surface active opto-components, ve
rtical cavity surface emitting lasers (VCSELs) or photodetectors are flip-c
hip mounted on the solder bumps, and are self-aligned to the carrier during
the soldering process. Finally optical fibers are inserted and glued in th
e fiber holes, thereby aligning them to the opto-components. Alignment expe
riments with multi-mode VCSELs show a coupling efficiency of > 90%. (C) 200
0 Elsevier Science S.A. All rights reserved.