The GaN material parameters relevant to the negative differential resistanc
e (NDR) devices are discussed, and their physical models based on the theor
etical predictions and experimental device characteristics are introduced.
Gunn diode design criteria were applied to design the GaN NDR diodes. A hig
her electrical strength of the GaN allowed operation with higher doping (si
milar to 10(17) cm(-3)) and at a higher bias (90 V for a 3 mu m thick diode
). The transient hydrodynamic simulations were used to carry out the harmon
ic power analysis of the GaN NDR diode oscillators in order to evaluate the
ir large-signal microwave characteristics. The GaAs Gunn diode oscillators
were also simulated for a comparison and verification purposes. The depende
nce of the oscillation frequency and output power on the GaN NDR diode desi
gn and operating conditions are reported. It was found that, due to the hig
her electron velocities and reduced time constants, GaN NDR diodes offered
twice the frequency capability of the GaAs Gunn diodes (87 GHz vs. 40 GHz),
while their output power density was 2 x 10(5) W/cm(2) compared with simil
ar to 10(3) W/cm(2) for the GaAs devices. The reported improvements in the
microwave performance are supported by the high value of the GaN Pf (2)Z fi
gure of merit, which is 50-100 times higher than the GaAs, indicating a str
ong potential of the GaN for the microwave signal generation. (C) 2000 Else
vier Science Ltd. All rights reserved.