An accurate relationship for determining the key parameters of MOSFETs by proportional difference operator method

Citation
Jy. Wang et al., An accurate relationship for determining the key parameters of MOSFETs by proportional difference operator method, SOL ST ELEC, 44(6), 2000, pp. 959-962
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
SOLID-STATE ELECTRONICS
ISSN journal
00381101 → ACNP
Volume
44
Issue
6
Year of publication
2000
Pages
959 - 962
Database
ISI
SICI code
0038-1101(200006)44:6<959:AARFDT>2.0.ZU;2-5
Abstract
An improved version of the proportional difference operator method is prese nted for the determination of key parameters of a MOSFET, including thresho ld voltage and carrier mobility, and results in the proportional difference output characteristics of a MOSFET, which manifests spectral property. The accurate relationship between key parameters and the peak of the proportio nal difference output characteristic is provided. Subsequently, a simple di scussion of the practical application of this method under different bias c onditions, i.e. substrate biases, is also given. Further, some approximate equations with enough accuracy are provided to simplify the calculation com plexity. (C) 2000 Elsevier Science Ltd. All rights reserved.