We report on the growth and structure of Ag(001)/Fe(001) superlattices stud
ied in situ by reflection high-energy electron diffraction (RHEED) and ex s
itu by Rutherford backscattering and channeling spectroscopy (RBS/C), X-ray
diffraction (XRD) and atomic force microscopy (AFM). These complementary c
haracterization methods have been compared and applied to a detailed invest
igation of the epitaxial quality and the interface roughness. The apparent
inconsistency in the results is explained by the difference in length scale
probed by the four characterization techniques. (C) 2000 Elsevier Science
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