HIGH-PRESSURE X-RAY-DIFFRACTION STUDY OF BETA-SI3N4

Authors
LI YM KRUGER MB NGUYEN JH CALDWELL WA JEANLOZ R
Citation
Ym. Li et al., HIGH-PRESSURE X-RAY-DIFFRACTION STUDY OF BETA-SI3N4, Solid state communications, 103(2), 1997, pp. 107-112
Citations number
19
Categorie Soggetti
Physics, Condensed Matter
Journal title
Solid state communications → ACNP
ISSN journal
00381098
Volume
103
Issue
2
Year of publication
1997
Pages
107 - 112
Database
ISI
SICI code
0038-1098(1997)103:2<107:HXSOB>2.0.ZU;2-2
Abstract
X-ray diffraction data collected at quasi-hydrostatic pressures of 5-3 4 GPa yield an average zero-pressure bulk modulus and pressure derivat ive of K-0 = 270(+/-5) GPa and K-0' = 4.0(+/-1.8) for beta-Si3N4 at ro om temperature. Similar linear incompressibilities along the a and c c rystallographic directions document that compression is nearly isotrop ic. (C) 1997 Elsevier Science Ltd.