Simultaneous imaging of dielectric properties and topography in a PbTiO3 crystal by near-field scanning microwave microscopy

We use a near-field scanning microwave microscope to simultaneously image t he dielectric constant, loss tangent, and topography in a PbTiO3 crystal. B y this method, we study the effects of the local dielectric constant and lo ss tangent in the geometry of periodic domains on the measured resonant fre quency, and quality factor. We also carry out theoretical calculations and the results agree well with the experimental data and reveal the anisotropi c nature of the dielectric constant. (C) 2000 American Institute of Physics . [S0003-6951(00)05022-1].