G. Binnig et H. Rohrer, Scanning tunneling microscopy (Reprinted from IBM Journal of Research and development, vol 30, 1986), IBM J RES, 44(1-2), 2000, pp. 279-293
Presented here is an overview of the present status and future prospects of
scanning tunneling microscopy. Topics covered include the physical basis o
f the scanning tunneling microscope, its instrumentation aspects, and its u
se for structural and spectroscopic imaging-on a scale which extends to ato
mic dimensions. Associated experimental and theoretical studies are reviewe
d, including several which suggest potential applicability of this new type
of microscope to a relatively broad range of biological, chemical, and tec
hnological areas.