An improved DC model of low- and high-power GaAs MESFETs is proposed. Third
-order dependence of fitting parameters on bias conditions is included. The
main objective is to obtain a very good agreement between measured and sim
ulated I-V curves, particularly in the knee and saturation regions, regardl
ess of the technological characteristics of the device. The model has been
compared with the most significant models presented in the literature, show
ing some significant improvements of the state-of-the-art.