Whole-profile structure solution from powder diffraction data using simulated annealing

Authors
Citation
Aa. Coelho, Whole-profile structure solution from powder diffraction data using simulated annealing, J APPL CRYS, 33(2), 2000, pp. 899-908
Citations number
20
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898 → ACNP
Volume
33
Issue
2
Year of publication
2000
Part
3
Pages
899 - 908
Database
ISI
SICI code
0021-8898(20000601)33:2<899:WSSFPD>2.0.ZU;2-T
Abstract
Techniques and methods to facilitate the solution of structures by simulate d annealing have been developed from the starting point of a space group an d lattice parameters. The simulated-annealing control parameters have been systematically investigated and optimum values characterized and determined . Most significant is the inclusion of electrostatic-potential penalty func tions in a non-linear least-squares Rietveld refinement procedure. The long -range electrostatic potentials are calculated using a general real-space s ummation which can be used for all space groups. In addition, a general wei ghting scheme for penalty functions negates the need to determine weighting schemes experimentally. Also investigated and improved is the non-linear l east-squares minimization procedure used in the refinement of structural pa rameters. The behaviour and success of the techniques have been tested on X -ray diffraction powder data against the known structures of AlVO4 in P1 wi th 18 atoms in the asymmetric unit, K2HCr2AsO10 in P3(1) with 15 atoms in t he asymmetric unit excluding hydrogen, and [Co(NH3)(5)CO3]NO3 .H2O in P12(1 ) with 15 atoms in the asymmetric unit excluding hydrogen.