In-situ observation of small-angle X-ray scattering by dislocations

Citation
Gg. Long et al., In-situ observation of small-angle X-ray scattering by dislocations, J APPL CRYS, 33(1), 2000, pp. 456-460
Citations number
13
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898 → ACNP
Volume
33
Issue
1
Year of publication
2000
Part
3
Pages
456 - 460
Database
ISI
SICI code
0021-8898(20000601)33:1<456:IOOSXS>2.0.ZU;2-O
Abstract
Ultra-small-angle X-ray scattering by dislocations in single-crystal alumin um has been observed in situ as a function of plastic deformation. The scat tering is strongly dependent upon sample orientation, with single dislocati ons, dislocation dipoles, and the dislocation distribution within walls eac h exhibiting distinct scattering profiles. Among the microstructural featur es that have been observed are: the correlations between the ordered fracti on of dislocations, the presence of dislocation dipoles, the increasing dis location content with increasing strain, and the decreasing width of the in terface between dislocation walls and the surrounding nearly-dislocation-fr ee material with increasing deformation.