Jd. Barnes et al., Microstructure analysis using temperature-induced contrast variation in small-angle scattering, J APPL CRYS, 33(1), 2000, pp. 758-762
We propose to introduce Temperature-Induced Contrast Variation (TICV) as a
technique for improving the specificity of microstructure analyses obtained
using small-angle scattering methods. TICV exploits the fact that, at temp
eratures well removed from melting or annealing regimes, the scattering con
trast in many multicomponent systems exhibits a significant temperature dep
endence while the form factors for the scattering processes change only sli
ghtly. Difference scattering patterns formed by subtracting the pattern mea
sured at a suitable reference temperature from the pattern obtained at anot
her temperature emphasize those components of the microstructure that vary
most strongly with temperature over the chosen range. This can facilitate a
n effective separation of the observed scattering patterns into separate co
mponents for differing scattering mechanisms. Examples of distinct scatteri
ng mechanisms commonly found in polymers include liquidlike scattering from
amorphous components, contributions from the intramolecular amorphous halo
, Guinier scattering from inclusions, and the scattering from ordered stack
s of crystalline lamellae.
The experimental data presented here provide qualitative demonstrations of
general features of the method. Further work is needed to obtain improved d
escriptors to characterize microstructure in these systems.