ANGULAR DEPENDENT SOFT-X-RAY ABSORPTION-SPECTROSCOPY OF VANADIUM-OXIDES

Citation
E. Goering et al., ANGULAR DEPENDENT SOFT-X-RAY ABSORPTION-SPECTROSCOPY OF VANADIUM-OXIDES, Physica. B, Condensed matter, 194, 1994, pp. 1217-1218
Citations number
2
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
09214526
Volume
194
Year of publication
1994
Part
1
Pages
1217 - 1218
Database
ISI
SICI code
0921-4526(1994)194:<1217:ADSAOV>2.0.ZU;2-T
Abstract
We have used angle-dependent soft x-ray absorption spectroscopy to stu dy the nature and orientation of the unoccupied states of V2O5, V6O13, VO2, and V2O3. In the oxygen K edge (vanadium L(III) and L(II)) spect rum of V6O13 and V2O5, pre edge features are apparent; these vary dram atically with the angle between crystal axes and the polarization vect or of the incident synchrotron radiation. The O K- edge (V L- edge) x- ray absorption spectra probe unoccupied states of O 2p (V 3d) symmetry , and the angular dependence thus reveals the spatial orientation and character of these hybridized O 2p - V 3d molecular orbitals in those highly anisotropic materials.