Selenium- and sulfur-doped amorphous hydrogenated silicon films were prepar
ed by the conventional plasma-enhanced chemical vapor deposition (PECVD) te
chnique. Both Se- and S-doped films have band gaps that range from 1.7 to 2
.0 eV, as a function of doping concentration. The photoresponse of the film
s was determined by illuminating with white light of 100 mW/cm(2) intensity
. The intensity variation of photoconductivity (PC) showed monomolecular re
combination mechanism for a-Si:H films doped with Se (for H2Se/SiH4 less th
an or equal to 10(-1)%) and S (for H2S/SiH4 less than or equal to 10(-2)%)
and bimolecular for other dopings. The persistent photoconductivity (PPC) m
easurements at room temperature showed that PPC increased with increasing i
rradiation time. PPC for Se-doped a-Si:H for a concentration of 10(-3) at.%
was of the same order as for 2.7 x 10(-2) at.% S-doped sample. Photodegrad
ation results indicate that a-Si,Se:H system would be more stable than the
a-Si,S:H system as the compensation of the photodegradation due to PPC is l
arger in the case of Se-doped films. (C) 2000 Elsevier Science B.V. All rig
hts reserved.